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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:
Summary Page
Tab Page Summary

General:
Element:
S
Formula:
W2O2(S2)(S2CN(C2H5)2)2
XPS Formula:
S in dithiocarbamate ligand
Name:
di-mu-thio-bis(oxotungsten) bis(diethyldithiocarbamate)
CAS Registry No:
Class:
oxygen ligand, sulfur, sulfur ligand, thiourea

Citation:
Author Name(s):
Ansari M.A., Chandrasekaran J., Sarkar S.
Journal:
Bull. Chem. Soc. Jpn. 61, 2265
DOI:
Pub Year:
1988

Data Processing:
Data Type:
Photoelectron Line
Line Designation:
2p3/2
Binding Energy (eV)
162.90
Energy Uncertainty:
Background Subtraction Method:
other
Peak Location Method:
Gaussian
Full Width at Half-maximum Intensity (eV):
Gaussian Width (eV):
Lorentzian Width (eV):

Measurement:
Use of X-ray Monochromator:
No
Anode Material:
Al
X-ray Energy:
Overall Energy Resolution (eV):
Calibration:
Charge Reference:
Internal hydrocarbon
Energy Scale Evaluation:
Reliable, with one-point correction of energy scale
Comment:

Specimen:
Specimen:
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
Specimen Temperature (K):
300
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