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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:
Summary Page
Tab Page Summary

General:
Element:
N
Formula:
(-OC(O)NHC6H4CH2C6H4NHC(O)OCH2(CF2)2CH2-)n
Name:
poly(oxycarbonylamino-1,4-phenylenemethylene-1,4-phenyleneaminocarbonyloxy(2,2,3,3-tetrafluorobutane-diyl))
CAS Registry No:
Class:
amide, halogenated compound, multiple rings, nitrogen, oxygen, phenyl benzene, polymer, sulfur

Citation:
Author Name(s):
Yoon S.C., Ratner B.D.
Journal:
Macromolecules 19, 1068
DOI:
Pub Year:
1986

Data Processing:
Data Type:
Photoelectron Line
Line Designation:
1s, sat
Binding Energy (eV)
406.60
Energy Uncertainty:
Background Subtraction Method:
other
Peak Location Method:
Gaussian
Full Width at Half-maximum Intensity (eV):
Gaussian Width (eV):
Lorentzian Width (eV):

Measurement:
Use of X-ray Monochromator:
Yes
Anode Material:
Al
X-ray Energy:
Overall Energy Resolution (eV):
Calibration:
Au4f7 = 84.00
Charge Reference:
Internal hydrocarbon
Energy Scale Evaluation:
Reliable, with one-point correction of energy scale
Comment:
An electron flood gun (Ep=10-15 eV) was used for charge compensation. The films were 200 - 800 A in thickness. The composition determined by XPS was C65.31O13.76N7.21F13.71

Specimen:
Specimen:
Method of Determining Specimen Composition:
X-ray Photoelectron Spectroscopy
Method of Determining Specimen Crystallinity:
Specimen Temperature (K):
300
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