NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

Element:

Formula:

C₆H₅S(O)₂NH(C₄H₂N(S))C₆H₅

XPS Formula:

S in sulfonamido group

Name:

1-benzenesulfonamido-4-phenyl-2(1H)pyrimidinethion

CAS Registry No:

Class:

nitrogen, oxygen, phenyl benzene, sulfonyl, sulfur

Citation:

Author Name(s):

Doring M., Uhlig E., Undeutsch B., Gloe K., Muhl P.

Journal:

Z. Anorg. Allg. Chem. 567, 153

DOI:

Pub Year:

1988

book All Records in this Publication

Data Processing:

Photoelectron Line

162.10

0.3

Background Subtraction Method:

other

Peak Location Method:

Gaussian

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Charge Reference:

Internal hydrocarbon

Energy Scale Evaluation:

Reliable, with one-point correction of energy scale

Comment:

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):

300