NIST X-ray Photoelectron Spectroscopy Database

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Total Records: 6

Element

Atomic No

Formula

Spectral Line

Energy (eV)

Details

DS-3d

0.59

Sn/Ge

DS-3d

0.59

Sn/Ge

SS1-3d_5/2

-0.60

SS1-3d_5/2

-0.60

SS2-3d_5/2

-0.23

Sn/Ge

SS2-3d_5/2

-0.23

Data Processing:

Data Type:

Surface Core-level Shift for the Second Layer of Atoms

Line Designation:

SS2-3d_5/2

Surface Core-Level Shift (eV) for the second Layer of Atoms

-0.23

Energy Uncertainty:

0.05

Background Subtraction Method:

other

Peak Location Method:

mixed Gaussian/Lorentzian

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

0.35

Lorentzian Width (eV):

0.15

Measurement:

Use of X-ray Monochromator:

Anode Material:

other source

X-ray Energy:

Overall Energy Resolution (eV):

0.30

Calibration:

Charge Reference:

Element

Energy Scale Evaluation:

Reliable (reported energy within 300 eV of a reference energy)

Comment:

2/3 ML/n-type doped Ge(100)c(2x1). The substrate was cleaned by Ar+ ion bombardment at 773 K and subsequently annealed (T = 973 K). Emission angle = 60 degrees.

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Low-energy Electron Diffraction

Specimen Temperature (K):

300