NIST X-ray Photoelectron Spectroscopy Database

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Total Records: 14

Element

Atomic No

Formula

Spectral Line

Energy (eV)

Details

C^-graphite

284.50

C^-graphite

284.42

CsC₈

284.66

CsC₈

285.70

CsC₈

285.00

C₂₃Cs

285.20

C₂₃Cs

284.82

C₂₃Cs

285.60

C₄₃Cs

284.79

C₄₃Cs

285.40

C₄₃Cs

285.20

C₄₃Cs

SS-3d_5/2

1.30

CsC₈

SS-3d_5/2

2.10

C₂₃Cs

SS-3d_5/2

1.30

Data Processing:

Photoelectron Line

285.60

0.5

Background Subtraction Method:

other

Peak Location Method:

mixed Gaussian/Lorentzian

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

0.97

Lorentzian Width (eV):

0.18

Measurement:

Use of X-ray Monochromator:

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Au4f7 = 84.00

Charge Reference:

Conductor

Energy Scale Evaluation:

Reliable (reported energy within 300 eV of a reference energy)

Comment:

Cs-intercallated compound. The relative intensity was 0.33. Peak locations: Doniach - Sunjic & Gaussian. Asymmetry parameter = 0.16.

Specimen:

Method of Determining Specimen Composition:

X-ray Photoelectron Spectroscopy

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):

300