NIST X-ray Photoelectron Spectroscopy Database

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Total Records: 8

Element

Atomic No

Formula

Spectral Line

Energy (eV)

Details

C₆H₅SH/Ni

162.50

C₆H₅SH/Ni

163.60

C₆H₅SH/Ni

284.30

C₆H₅SH/Ni

284.10

C₆H₅SH/Ni

163.60

C₆H₅SH/Ni

162.70

C₆H₅SH/Ni

161.90

C₆H₅SH/Ni

283.30

Data Processing:

Photoelectron Line

162.50

Background Subtraction Method:

Peak Location Method:

data

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Other, Ni3p3/2 = 66.08

Charge Reference:

Conductor

Energy Scale Evaluation:

Reliable, with one-point correction of energy scale

Comment:

0.16 ML (sulfur coverage) C6H5-SH/Ni(110). The substrate was cleaned by Ne+ ion bombardment and subsequently annealed (T = 1000 K, time = 60 s).

Specimen:

Method of Determining Specimen Composition:

Auger Electron Spectroscopy

Method of Determining Specimen Crystallinity:

Low-energy Electron Diffraction

Specimen Temperature (K):

100