NIST X-ray Photoelectron Spectroscopy Database

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Total Records: 8

Element

Atomic No

Formula

Spectral Line

Energy (eV)

Details

DS-2p

0.61

DS-3d

0.58

Si/Sb

INT-2p_3/2

0.23

Sb/Ge

INT-3d_5/2

-0.18

SS1-3d_5/2

-0.57

SS1-2p_3/2

-0.46

SS2-2p_3/2

0.26

SS2-3d_5/2

-0.21

Data Processing:

Data Type:

Surface Core-level Shift for the Second Layer of Atoms

Line Designation:

SS2-3d_5/2

Surface Core-Level Shift (eV) for the second Layer of Atoms

-0.21

Energy Uncertainty:

0.02

Background Subtraction Method:

other

Peak Location Method:

mixed Gaussian/Lorentzian

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

0.25

Lorentzian Width (eV):

0.19

Measurement:

Use of X-ray Monochromator:

Yes

Anode Material:

other source

X-ray Energy:

62.5

Overall Energy Resolution (eV):

0.25

Calibration:

Charge Reference:

Element

Energy Scale Evaluation:

Reliable (reported energy within 300 eV of a reference energy)

Comment:

The clean Ge(100) surface was prepared by a 1073 K anneal. Peak locations: Voigt function. Branching ratio = 0.67. The intensity ratio of the surface/bulk components was 0.46.

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Low-energy Electron Diffraction

Specimen Temperature (K):

300