NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

Element:

Formula:

Bi₄Ge₂₀Se₇₆

Name:

bismuth germanium selenium alloy (4-20-76)

CAS Registry No:

Class:

alloy, chalcogenide, IV-VI semiconductor, thin film

Citation:

Author Name(s):

Kumar S., Kashyap S.C., Chopra K.L.

Journal:

J. Appl. Phys. 72, 2066

DOI:

Pub Year:

1992

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Data Processing:

Photoelectron Line

31.20

0.2

Background Subtraction Method:

Peak Location Method:

data

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Au4f7 = 84.00

Charge Reference:

Conductor

Energy Scale Evaluation:

Reliable, with one-point correction of energy scale

Comment:

n-type Bi4Ge20Se76. Bi content was determined by AES and atomic absorption spectrophotometry. FAT mode.

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

X-ray Diffraction, Transmission Electron Microscopy

Specimen Temperature (K):

300