NIST X-ray Photoelectron Spectroscopy Database

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Total Records: 16

Element

Atomic No

Formula

Spectral Line

Energy (eV)

Details

Bi₄Ge₂₀Se₇₆

31.20

Bi₄Ge₂₀Se₇₆

54.80

Bi₄Ge₂₀Se₇₆

4f_7/2

158.40

Bi₄Ge₂₀Se₇₆

4f_5/2

163.80

Bi₁₀Ge₂₀Se₇₀

31.00

Bi₁₀Ge₂₀Se₇₀

54.60

Bi₁₀Ge₂₀Se₇₀

4f_7/2

159.00

Bi₁₀Ge₂₀Se₇₀

4f_5/2

163.70

As₄₀Bi₄Se₅₆

43.30

As₄₀Bi₄Se₅₆

54.30

As₄₀Bi₄Se₅₆

4f_7/2

158.10

As₄₀Bi₄Se₅₆

4f_5/2

163.50

As₄₀Bi₁₀Se₅₀

43.00

As₄₀Bi₁₀Se₅₀

54.00

As₄₀Bi₁₀Se₅₀

4f_7/2

158.10

As₄₀Bi₁₀Se₅₀

4f_5/2

163.50

Data Processing:

Photoelectron Line

4f_7/2

158.40

0.2

Background Subtraction Method:

Peak Location Method:

data

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Au4f7 = 84.00

Charge Reference:

Conductor

Energy Scale Evaluation:

Reliable, with one-point correction of energy scale

Comment:

n-type Bi4Ge20Se76. Bi content was determined by AES and atomic absorption spectrophotometry. FAT mode.

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

X-ray Diffraction, Transmission Electron Microscopy

Specimen Temperature (K):

300