NIST X-ray Photoelectron Spectroscopy Database

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Total Records: 10

Element

Atomic No

Formula

Spectral Line

Energy (eV)

Details

SiO₂,quartz

532.10

Na₂Si₃O₇

530.30

Na₂Si₃O₇

532.40

Na₂Si₈O₁₇

529.80

Na₂Si₈O₁₇

532.20

SiO₂

532.10

Na₂O(SiO₂)₃

530.30

Na₂O(SiO₂)₃

532.40

Na₂O(SiO₂)₈

529.80

Na₂O(SiO₂)₈

532.20

Data Processing:

Photoelectron Line

532.40

Background Subtraction Method:

Shirley

Peak Location Method:

mixed Gaussian/Lorentzian

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Au4f7 = 84.00

Charge Reference:

Adventitious carbon

Energy Scale Evaluation:

Reliable, with one-point correction of energy scale

Comment:

The sample was broken under UHV. The intensity ratio of the Gaussian/Lorentzian components was 0.55.

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):

300