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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:
Summary Page
Tab Page Summary

General:
Element:
Se
Formula:
Ni0.98Se
Name:
nickel selenide
CAS Registry No:
Class:
chalcogenide, II-VI semiconductor, selenide

Citation:
Author Name(s):
Matoba M., Anzai S., Fujimori A.
Journal:
J. Phys. Soc. Japan 60, 4230
DOI:
Pub Year:
1991

Data Processing:
Data Type:
Photoelectron Line
Line Designation:
3p3/2
Binding Energy (eV)
160.37
Energy Uncertainty:
0.05
Background Subtraction Method:
other
Peak Location Method:
mixed Gaussian/Lorentzian
Full Width at Half-maximum Intensity (eV):
Gaussian Width (eV):
0.98
Lorentzian Width (eV):
1.40

Measurement:
Use of X-ray Monochromator:
No
Anode Material:
Mg
X-ray Energy:
Overall Energy Resolution (eV):
1
Calibration:
Au4f7 = 84.00
Charge Reference:
Conductor
Energy Scale Evaluation:
Reliable (reported energy within 300 eV of a reference energy)
Comment:
The sample was cleaned by Ar+ ion bombardment (Ep = 0.5 keV, time = 1 min, normal incidence). Branching ratio = 0.5.

Specimen:
Specimen:
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
Specimen Temperature (K):
300
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