NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

WOx/W

W*Ox/W

tungsten oxides/tungsten

CAS Registry No:

Class:

non-stoichiometric oxide, oxide

Citation:

Author Name(s):

Peignon M.C., Cardinaud C., Turban G.

Journal:

J. Appl. Phys. 70, 3314

DOI:

Pub Year:

1991

book All Records in this Publication

Data Processing:

Photoelectron Line

4f_7/2

35.90

Background Subtraction Method:

Peak Location Method:

data

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Other, W4f7/2 = 31.37

Charge Reference:

Conductor

Energy Scale Evaluation:

Reliable, with one-point correction of energy scale

Comment:

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):

300