NIST X-ray Photoelectron Spectroscopy Database

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Total Records: 18

Element

Atomic No

Formula

Spectral Line

Energy (eV)

Details

Pt/Si

CS-2p

1.05

Pt/Si

CS-4f_7/2

1.70

Pt/Si

CS-4f_7/2

0.00

Pt/Si

CS-2p

1.00

Pt/Si

4f_7/2

71.22

Pt/Si

99.72

Si/Pt

98.97

Pt/Si

4f_7/2

72.82

Pt/Si

100.22

Si/Pt

98.97

99.22

Si/Ir

99.02

Si/Ir

99.52

Ir/Si

4f_7/2

60.82

Si/Ir

99.62

Si/Ir

99.07

Si/Ir

4f_7/2

61.12

4f_7/2

60.82

Data Processing:

Photoelectron Line

99.22

Background Subtraction Method:

other

Peak Location Method:

mixed Gaussian/Lorentzian

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

0.7

Calibration:

Pt4f7 = 71.12

Charge Reference:

Conductor

Energy Scale Evaluation:

Reliable (reported energy within 300 eV of a reference energy)

Comment:

p-type Si(100)-(2x1) with a resistivity of 3 ohm cm was cleaned by annealing (T =1023 K, time = 20 min). Peak locations: Voigt function.

Specimen:

Method of Determining Specimen Composition:

X-ray Photoelectron Spectroscopy

Method of Determining Specimen Crystallinity:

Low-energy Electron Diffraction

Specimen Temperature (K):

300