NIST X-ray Photoelectron Spectroscopy Database

Click the column to sort in ascending or descending order.
Enter a string in the input box in the column header and press the enter to filter the search result in the selected column.
Click on the hyperlink in the column for more information.

Total Records: 18

Element

Atomic No

Formula

Spectral Line

Energy (eV)

Details

Pt/Si

CS-2p

1.05

Pt/Si

CS-4f_7/2

1.70

Pt/Si

CS-4f_7/2

0.00

Pt/Si

CS-2p

1.00

Pt/Si

4f_7/2

71.22

Pt/Si

99.72

Si/Pt

98.97

Pt/Si

4f_7/2

72.82

Pt/Si

100.22

Si/Pt

98.97

99.22

Si/Ir

99.02

Si/Ir

99.52

Ir/Si

4f_7/2

60.82

Si/Ir

99.62

Si/Ir

99.07

Si/Ir

4f_7/2

61.12

4f_7/2

60.82

Data Processing:

Photoelectron Line

4f_7/2

60.82

Background Subtraction Method:

Shirley

Peak Location Method:

mixed Gaussian/Lorentzian

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

0.7

Calibration:

Pt4f7 = 71.12

Charge Reference:

Conductor

Energy Scale Evaluation:

Reliable, with one-point correction of energy scale

Comment:

Full width 1.2eV.

Specimen:

Method of Determining Specimen Composition:

X-ray Photoelectron Spectroscopy

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):

300