NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0
Details Summary:
Tab Page Summary
General:
In
In
indium
7440-74-6
element
Citation:
Riffe D.M., Wertheim G.K., Buchanan D.N.E., Citrin P.H.
Phys. Rev. B 45, 6216
Pub Year:
1992
Data Processing:
Surface Core-level Shift
SS-4d
mixed Gaussian/Lorentzian
0.075
Measurement:
Anode Material:
other source
X-ray Energy:
40.8
Overall Energy Resolution (eV):
.075
Calibration:
Charge Reference:
Conductor
Energy Scale Evaluation:
Reliable (reported energy within 300 eV of a reference energy)
Comment:
In(100). The SCLS was less than 0.1 eV. Singularity index = 0.14.
Specimen:
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
Specimen Temperature (K):
78, 295