NIST X-ray Photoelectron Spectroscopy Database

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Total Records: 3

Data Processing:

Chemical Shift

CS-2p_3/2

3.10

0.2

Background Subtraction Method:

other

Peak Location Method:

Gaussian

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Yes

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Au4f7 = 84.00

Charge Reference:

Element

Energy Scale Evaluation:

Reliable (reported energy within 300 eV of a reference energy)

Comment:

10 A GaAsOx/n-type GaAs(100). The oxide was formed by O2 exposure (p = 100 Torr, T = 773 K, time = 1000 s). The energy is referenced to the bulk state of the As2p3/2 line.

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):

300