NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

Cu₂S

copper(I) sulfide

22205-45-4

chalcogenide, IV-VI semiconductor, mineral, sulfide

Citation:

Author Name(s):

Deroubaix G., Marcus P.

Journal:

Surf. Interface Anal. 18, 39

DOI:

Pub Year:

1992

book All Records in this Publication

Data Processing:

Photoelectron Line

2p_3/2

932.90

0.1

Background Subtraction Method:

Peak Location Method:

data

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Au,Cu = 84.00,932.67

Charge Reference:

Adventitious carbon

Energy Scale Evaluation:

Reliable (reported energy within 300 eV of a reference energy)

Comment:

A pure copper sample was first annealed under H2 (T = 1173 K, time = 90 min) and the sulfided in a gas mixture H2/H2S (T = 873 K, time = 6 h).

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):

300