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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:
Summary Page
Tab Page Summary

General:
Element:
Cu
Formula:
Cu2S
Name:
copper(I) sulfide
CAS Registry No:
22205-45-4
Class:
chalcogenide, IV-VI semiconductor, mineral, sulfide

Citation:
Author Name(s):
Deroubaix G., Marcus P.
Journal:
Surf. Interface Anal. 18, 39
DOI:
Pub Year:
1992

Data Processing:
Data Type:
Auger-Electron Line
Line Designation:
L3M45M45(1G)
Kinetic Energy (eV)
916.80
Energy Uncertainty:
0.1
Background Subtraction Method:
Peak Location Method:
data
Full Width at Half-maximum Intensity (eV):
Gaussian Width (eV):
Lorentzian Width (eV):

Measurement:
Use of X-ray Monochromator:
No
Anode Material:
Mg
X-ray Energy:
Overall Energy Resolution (eV):
Calibration:
Au,Cu = 84.00,932.67
Charge Reference:
Adventitious carbon
Energy Scale Evaluation:
Reliable, with one-point correction of energy scale
Comment:
A pure copper sample was first annealed under H2 (T = 1173 K, time = 90 min) and the sulfided in a gas mixture H2/H2S (T = 873 K, time = 6 h). For calibration, the Cu L3M45M45 transition at 334.95 eV was also used.

Specimen:
Specimen:
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
Specimen Temperature (K):
300
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