NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

Element:

Formula:

W₂(mu^-H)(mu^-Cl)Cl₄(C₅H₅N)₄

XPS Formula:

W*₂(mu^-H)(mu^-Cl)Cl₄(C₅H₅N)₄

Name:

tetrakis(pyridine)tetrachloro(mu-chloro)(mu-hydrido)ditungsten(W-W)

CAS Registry No:

Class:

chloride, cluster, hydride, organometallic, other ring

Citation:

Author Name(s):

Carlin R.T., McCarley R.E.

Journal:

Inorg. Chem. 28, 2604

DOI:

Pub Year:

1989

book All Records in this Publication

Data Processing:

Photoelectron Line

4f_5/2

34.60

Background Subtraction Method:

other

Peak Location Method:

Gaussian

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Charge Reference:

Adventitious carbon

Energy Scale Evaluation:

Reliable, with one-point correction of energy scale

Comment:

Quadruply bonded tungsten dimer.

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):

293