NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

Element:

Formula:

C₂₁H₁₄O₂F₄N₄

XPS Formula:

C atoms in tetrafluorophenylene

Name:

poly(aminocarbonylamino-phenylenemethylene-phenyleneaminocarbonylamino-tetrafluorophenylene)

CAS Registry No:

100243-88-7

Class:

amine, nitrogen, oxygen, phenyl benzene, polymer, urea

Citation:

Author Name(s):

Yoon S.C., Ratner B.D.

Journal:

Macromolecules 19, 1068

DOI:

Pub Year:

1986

book All Records in this Publication

Data Processing:

Photoelectron Line

287.60

Background Subtraction Method:

Peak Location Method:

Gaussian

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Yes

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Au4f7 = 84.00

Charge Reference:

Internal hydrocarbon

Energy Scale Evaluation:

Reliable, with one-point correction of energy scale

Comment:

An electron flood gun (Ep=10-15 eV) was used to charge neutralization.

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):

300