NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

Element:

Formula:

[As(CH₃^-C₆H₄)₃]₃RuCl₃RuCl₂[As(CH₃^-C₆H₄)₃]

XPS Formula:

[As(CH₃^-C₆H₄)₃]₃RuCl*₃RuCl*₂[As(CH₃^-C₆H₄)₃]

Name:

1-tris(tri-p-tolylarsine)-tris(mu-chloro)-2-dichloro-2-(tri-p-tolylarsine)-1,2-diruthenium

CAS Registry No:

Class:

arsenic, chloride, organometallic, phenyl benzene

Citation:

Author Name(s):

Brant P., Stephenson T.A.

Journal:

Inorg. Chem. 26, 22

DOI:

Pub Year:

1987

bookAll Records in this Publication

Data Processing:

Photoelectron Line

2p_3/2

198.70

0.1

Background Subtraction Method:

Peak Location Method:

data

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Charge Reference:

Internal hydrocarbon

Energy Scale Evaluation:

Reliable, with one-point correction of energy scale

Comment:

[As(p-tolyl)3]3RuCl3RuCl2[As(p-tolyl)3]. A solvent cast film.

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):

300