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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:
Summary Page
Tab Page Summary

General:
Element:
N
Formula:
(C2H5)2NC6H4CHNN(C6H5)2
XPS Formula:
(C2H5)2N*C6H4CHNN(C6H5)2
Name:
4-diethylaminobenzaldehyde diphenylhydrazone
CAS Registry No:
Class:
azo, nitrogen, phenyl benzene

Citation:
Author Name(s):
Waltman R.J., Pacansky J., Bates C.W., Jr
Journal:
Chem. Mater. 5, 1799
DOI:
Pub Year:
1993

Data Processing:
Data Type:
Photoelectron Line
Line Designation:
1s
Binding Energy (eV)
399.50
Energy Uncertainty:
Background Subtraction Method:
other
Peak Location Method:
other type of curve fit
Full Width at Half-maximum Intensity (eV):
Gaussian Width (eV):
Lorentzian Width (eV):

Measurement:
Use of X-ray Monochromator:
No
Anode Material:
Al
X-ray Energy:
Overall Energy Resolution (eV):
Calibration:
Charge Reference:
Internal hydrocarbon
Energy Scale Evaluation:
Reliable, with one-point correction of energy scale
Comment:
The film thickness was 1800 A. The composition determined by XPS was C0.886N0.114. No radiation damage was detected.

Specimen:
Specimen:
Method of Determining Specimen Composition:
X-ray Photoelectron Spectroscopy
Method of Determining Specimen Crystallinity:
Specimen Temperature (K):
300
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