NIST X-ray Photoelectron Spectroscopy Database

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Total Records: 12

Element

Atomic No

Formula

Spectral Line

Energy (eV)

Details

DS-3d

0.59

Ag/Ge

DS-3d

0.59

Ag/Si

DS-2p

0.61

Ag/Ge

INT-3d_5/2

0.33

Ag/Ge

INT-3d_5/2

-0.33

Ag/Ge

INT-3d_5/2

0.33

Ag/Ge

INT-3d_5/2

-0.26

Ag/Si

INT-2p_3/2

0.27

Ag/Ge

INT-3d_5/2

-0.35

Ag/Ge

SS-3d

-0.74

SS-3d_5/2

-0.27

SS-3d

-0.74

Data Processing:

Data Type:

Interface Core-Level Shift

Line Designation:

INT-3d_5/2

Interface Core-Level Shift

-0.35

Energy Uncertainty:

Background Subtraction Method:

other

Peak Location Method:

mixed Gaussian/Lorentzian

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

0.35

Lorentzian Width (eV):

0.15

Measurement:

Use of X-ray Monochromator:

Yes

Anode Material:

other source

X-ray Energy:

Overall Energy Resolution (eV):

0.35

Calibration:

Charge Reference:

Element

Energy Scale Evaluation:

Reliable (reported energy within 300 eV of a reference energy)

Comment:

8 A Ag/Ge(111). Undoped Ge was cleaned by Ar+ ion bombardment and annealed until a sharp c(2x8) LEED pattern emerged. Singularity index = 0.05. Branching ratio = 0.67.

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

XPS–scanning Tunneling Microscopy, Low-energy Electron Diffraction

Specimen Temperature (K):

300