NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

Ag/Si

silver/silicon

7440-21-3

element

Citation:

Author Name(s):

Le Lay G., Johnson R.L., Seemann R., Grey F., Feidenhans'l R., and Nielsen M.

Journal:

Surf. Sci. 287, 539

DOI:

Pub Year:

1993

book All Records in this Publication

Data Processing:

Data Type:

Interface Core-Level Shift

Line Designation:

INT-2p_3/2

Interface Core-Level Shift

0.27

Energy Uncertainty:

Background Subtraction Method:

other

Peak Location Method:

mixed Gaussian/Lorentzian

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

0.55

Lorentzian Width (eV):

0.07

Measurement:

Use of X-ray Monochromator:

Yes

Anode Material:

other source

X-ray Energy:

110

Overall Energy Resolution (eV):

0.35

Calibration:

Charge Reference:

Element

Energy Scale Evaluation:

Reliable (reported energy within 300 eV of a reference energy)

Comment:

Si(111)-(R3xR3)-Ag. Branching ratio = 0.56.

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

XPS–scanning Tunneling Microscopy, Low-energy Electron Diffraction

Specimen Temperature (K):

300