NIST X-ray Photoelectron Spectroscopy Database

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Total Records: 9

Element

Atomic No

Formula

Spectral Line

Energy (eV)

Details

O₂/Rh

CS-3d_5/2

0.65

O₂/Rh

CS-3d_5/2

0.65

Rh/NO

CS-3d_5/2

0.65

O₂/Rh

INT-3d_5/2

-0.15

Rh/NO

INT-3d_5/2

1.05

O₂/Rh

SS-3d_5/2

0.00

O₂/Rh

SS-3d_5/2

0.00

SS-3d_5/2

-0.65

SS-3d_5/2

-0.45

Data Processing:

Data Type:

Interface Core-Level Shift

Line Designation:

INT-3d_5/2

Interface Core-Level Shift

1.05

Energy Uncertainty:

0.05

Background Subtraction Method:

other

Peak Location Method:

mixed Gaussian/Lorentzian

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

0.4

Lorentzian Width (eV):

0.3

Measurement:

Use of X-ray Monochromator:

Yes

Anode Material:

other source

X-ray Energy:

395

Overall Energy Resolution (eV):

0.55

Calibration:

Charge Reference:

Conductor

Energy Scale Evaluation:

Reliable (reported energy within 300 eV of a reference energy)

Comment:

5 L NO was dosed onto Rh(110)-c(2x8) at 125 K. The Rh(110) sample was cleaned by many cycles of ion bombardment, annealing and treatment in O2 at 1E-7 mbar and 1100 K, followed by flashing to 1400 K. The emission angles were 0 and 70 degrees. Peak locations: Doniach - Sunjic & Gaussian.

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Low-energy Electron Diffraction

Specimen Temperature (K):

125