NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

Rh

Rh/NO

rhodium/nitrogen oxide

CAS Registry No:

7440-16-6

element

Citation:

Author Name(s):

Morgante A., Cvetko D., Santoni A., Prince K.C., Dhanak V.R., Comelli G. et al.

Surf. Sci. 285, 227

Pub Year:

1993

book All Records in this Publication

Data Processing:

Interface Core-Level Shift

Line Designation:

INT-3d_5/2

Interface Core-Level Shift

1.05

Energy Uncertainty:

0.05

Background Subtraction Method:

other

Peak Location Method:

mixed Gaussian/Lorentzian

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

0.4

Lorentzian Width (eV):

0.3

Measurement:

Use of X-ray Monochromator:

Yes

Anode Material:

other source

X-ray Energy:

395

Overall Energy Resolution (eV):

0.55

Calibration:

Charge Reference:

Conductor

Energy Scale Evaluation:

Reliable (reported energy within 300 eV of a reference energy)

Comment:

5 L NO was dosed onto Rh(110)-c(2x8) at 125 K. The Rh(110) sample was cleaned by many cycles of ion bombardment, annealing and treatment in O2 at 1E-7 mbar and 1100 K, followed by flashing to 1400 K. The emission angles were 0 and 70 degrees. Peak locations: Doniach - Sunjic & Gaussian.

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Low-energy Electron Diffraction

Specimen Temperature (K):

125

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