NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

S

TlV₃Cr₂S₈

thallium trivanadium dichromium octasulfide

CAS Registry No:

chalcogenide, II-VI semiconductor, sulfide

Citation:

Author Name(s):

Bensch W., Worner E., Muhler M.

Mater. Res. Bull. 29, 155

Pub Year:

1994

book All Records in this Publication

Data Processing:

Photoelectron Line

Line Designation:

2p

Binding Energy (eV)

161.60

Energy Uncertainty:

Background Subtraction Method:

Shirley

Peak Location Method:

data

Full Width at Half-maximum Intensity (eV):

2.6

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

No

Anode Material:

Al

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Au4f7 = 84.00

Charge Reference:

Conductor

Energy Scale Evaluation:

Reliable (reported energy within 300 eV of a reference energy)

Comment:

Weighted amounts of the elements were heated to 1273 K for seven days and afterwards were slowly cooled to 300 K. The product consisted of black needles with a metallic lustre. The composition determined by XPS was TlV2.7Cr1.9S8.

Specimen:

Method of Determining Specimen Composition:

X-ray Photoelectron Spectroscopy

Method of Determining Specimen Crystallinity:

X-ray Diffraction

Specimen Temperature (K):

300

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