NIST X-ray Photoelectron Spectroscopy Database

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Total Records: 7

Element

Atomic No

Formula

Spectral Line

Energy (eV)

Details

DS-3d

0.57

Sn/Ge

DS-3d

0.57

Sn/Ge

SS-3d_5/2

-0.26

Sn/Ge

SS-3d_5/2

-0.64

SS-3d_5/2

-0.23

SS-3d_5/2

-0.73

SS-3d_5/2

0.17

Data Processing:

Data Type:

Surface Core-level Shift

Line Designation:

SS-3d_5/2

Surface Core-Level Shift (eV)

-0.23

Energy Uncertainty:

Background Subtraction Method:

other

Peak Location Method:

mixed Gaussian/Lorentzian

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

0.59

Lorentzian Width (eV):

0.30

Measurement:

Use of X-ray Monochromator:

Yes

Anode Material:

other source

X-ray Energy:

70, 90,110

Overall Energy Resolution (eV):

0.09

Calibration:

Charge Reference:

Element

Energy Scale Evaluation:

Reliable (reported energy within 300 eV of a reference energy)

Comment:

Ga-doped Ge(111)-c(2x8) with a resistivity of 0.004 - 0.1 ohm cm. LEED pattern was achieved after repeated cycles of Ar+ ion sputtering and annealing (T = 923K, time = 10 min). The Gaussian FWHM was 0.65 eV at 300 K.

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Low-energy Electron Diffraction

Specimen Temperature (K):

77, 300