There was a problem with the connection!

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:
Summary Page
Tab Page Summary

General:
Element:
Se
Formula:
GeSe2
Name:
germanium diselenide
CAS Registry No:
12065-11-1
Class:
chalcogenide, glass, II-VI semiconductor, IV-VI semiconductor, selenide

Citation:
Author Name(s):
Theye M.-L., Gheorgiu A., Senemaud C., Kotkata M.F., Kandil K.M.
Journal:
Phil. Mag. B 69, 209
DOI:
Pub Year:
1994

Data Processing:
Data Type:
Photoelectron Line
Line Designation:
3d5/2
Binding Energy (eV)
54.50
Energy Uncertainty:
0.1
Background Subtraction Method:
Peak Location Method:
Gaussian
Full Width at Half-maximum Intensity (eV):
1.1
Gaussian Width (eV):
Lorentzian Width (eV):

Measurement:
Use of X-ray Monochromator:
No
Anode Material:
Mg
X-ray Energy:
Overall Energy Resolution (eV):
Calibration:
Charge Reference:
Adventitious carbon
Energy Scale Evaluation:
Reliable, with one-point correction of energy scale
Comment:
The glass was prepared via a standard melt-quenching technique.

Specimen:
Specimen:
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
X-ray Diffraction
Specimen Temperature (K):
300
An error has occurred. This application may no longer respond until reloaded. Reload 🗙