NIST X-ray Photoelectron Spectroscopy Database

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Total Records: 21

Element

Atomic No

Formula

Spectral Line

Energy (eV)

Details

GeSe₂

3d_5/2

54.50

GeSe₂

3d_3/2

55.30

GeSe₂

31.30

GeSe₂

3d_5/2

54.50

GeSe₂

3d_3/2

55.30

GeSe₂

31.30

GeSe₂

3d_5/2

54.50

GeSe₂

3d_3/2

55.30

Ge₀.₂₀Se₀.₈₀

3d_5/2

55.00

Ge₀.₂₀Se₀.₈₀

3d_3/2

55.80

Ge₀.₂₀Se₀.₈₀

31.40

Ge₀.₃₃Se₀.₆₇

3d_5/2

54.50

Ge₀.₃₃Se₀.₆₇

3d_3/2

55.30

Ge₀.₃₃Se₀.₆₇

31.30

Ge₀.₄₃Se₀.₅₇

3d_5/2

54.60

Ge₀.₄₃Se₀.₅₇

3d_3/2

55.40

Ge₀.₄₃Se₀.₅₇

31.20

Ge₀.₅₀Se₀.₅₀

3d_5/2

54.30

Ge₀.₅₀Se₀.₅₀

3d_3/2

55.10

Ge₀.₅₀Se₀.₅₀

30.60

GeSe₂

31.30

Data Processing:

Photoelectron Line

3d_3/2

55.10

0.1

Background Subtraction Method:

Peak Location Method:

Gaussian

Full Width at Half-maximum Intensity (eV):

1.3

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Charge Reference:

Adventitious carbon

Energy Scale Evaluation:

Reliable, with one-point correction of energy scale

Comment:

The sample was prepared by thermal evaporation.

Specimen:

Method of Determining Specimen Composition:

Electron-Probe Microanalysis

Method of Determining Specimen Crystallinity:

X-ray Diffraction

Specimen Temperature (K):

300