NIST X-ray Photoelectron Spectroscopy Database

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Total Records: 4

Data Processing:

Data Type:

Interface Core-Level Shift

Line Designation:

INT-3d_5/2

Interface Core-Level Shift

-0.17

Energy Uncertainty:

0.02

Background Subtraction Method:

other

Peak Location Method:

mixed Gaussian/Lorentzian

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

0.24

Lorentzian Width (eV):

0.12

Measurement:

Use of X-ray Monochromator:

Yes

Anode Material:

other source

X-ray Energy:

62.5

Overall Energy Resolution (eV):

0.2

Calibration:

Charge Reference:

Conductor

Energy Scale Evaluation:

Reliable (reported energy within 300 eV of a reference energy)

Comment:

1 ML Sb/n-type Ge(100). After deposition of 2 ML Sb thermal annealing up to ~ 773 K was done to the formation of 1 ML of Sb on the surface. Branching ratio = 0.67. LEED pattern was (2x1).

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Low-energy Electron Diffraction

Specimen Temperature (K):

300