NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

Element:

Formula:

CoSi₂

XPS Formula:

exchange splitting, spin^-orbit interaction and d^-mixing effect

Name:

cobalt disilicide

CAS Registry No:

12017-12-8

Class:

silicide

Citation:

Author Name(s):

Sirotti F., De Santis M., Rossi G.

Journal:

Phys. Rev. B 48, 8299

DOI:

Pub Year:

1993

book All Records in this Publication

Data Processing:

Photoelectron Line

3p_1/2

61.43

Background Subtraction Method:

other

Peak Location Method:

mixed Gaussian/Lorentzian

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

0.38

Lorentzian Width (eV):

1.5

Measurement:

Use of X-ray Monochromator:

Anode Material:

other source

X-ray Energy:

170

Overall Energy Resolution (eV):

0.38

Calibration:

FL = Fermi level

Charge Reference:

Conductor

Energy Scale Evaluation:

Reliable (reported energy within 300 eV of a reference energy)

Comment:

Asymmetry parameter = 0.0.

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

X-ray Diffraction

Specimen Temperature (K):

300