NIST X-ray Photoelectron Spectroscopy Database

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Total Records: 10

Element

Atomic No

Formula

Spectral Line

Energy (eV)

Details

O₂/WC

CS-4f_7/2

0.29

O₂/WC

CS-4f_7/2

0.66

DS-4f

2.16

O₂/WC

DS-4f

2.16

O₂/WC

INT-4f_7/2

-0.29

O₂/WC

4f_7/2

31.80

283.50

4f_7/2

31.80

SS-4f_7/2

-0.38

SS-1s

-0.66

Data Processing:

Chemical Shift

CS-4f_7/2

0.29

0.01

Background Subtraction Method:

other

Peak Location Method:

mixed Gaussian/Lorentzian

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

0.23

Lorentzian Width (eV):

0.13

Measurement:

Use of X-ray Monochromator:

Yes

Anode Material:

other source

X-ray Energy:

100, 150

Overall Energy Resolution (eV):

0.1

Calibration:

FL = Fermi level

Charge Reference:

Conductor

Energy Scale Evaluation:

Reliable (reported energy within 300 eV of a reference energy)

Comment:

30, 100 and 300 L O2/WC(0001)-(1x1).The substrate was gently annealed in O2 to remove possible carbon form of graphite and subsequently flashed to remove the oxygen. The spectra were recorded at normal emission and 40 degrees.

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Low-energy Electron Diffraction

Specimen Temperature (K):

300