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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:
Summary Page
Tab Page Summary

General:
Element:
S
Formula:
Cr/MoS2
XPS Formula:
sulfur atoms attached to Cr
Name:
chromium/molybdenum disulfide
CAS Registry No:
1317-33-5
Class:
alloy, catalyst, chalcogenide, element, II-VI semiconductor, sulfide

Citation:
Author Name(s):
Durbin T.D., Lince J.R., Didziulis S.V., Shuh D.K., Yarmoff J.A.
Journal:
Surf. Sci. 302, 314
DOI:
Pub Year:
1994

Data Processing:
Data Type:
Photoelectron Line
Line Designation:
2p3/2
Binding Energy (eV)
161.90
Energy Uncertainty:
Background Subtraction Method:
other
Peak Location Method:
mixed Gaussian/Lorentzian
Full Width at Half-maximum Intensity (eV):
Gaussian Width (eV):
Lorentzian Width (eV):

Measurement:
Use of X-ray Monochromator:
Yes
Anode Material:
other source
X-ray Energy:
230
Overall Energy Resolution (eV):
Calibration:
FL = Fermi level
Charge Reference:
Conductor
Energy Scale Evaluation:
Reliable (reported energy within 300 eV of a reference energy)
Comment:
17 A Cr/MoS2(0001), natural molybdenite crystal, after annealing at 698 K. The substrate was cleaned by annealing (T = 973 K, time = 10 min). Branching ratio = 0.50. The Cr film thickness was determined by XPS.

Specimen:
Specimen:
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
Specimen Temperature (K):
300
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