NIST X-ray Photoelectron Spectroscopy Database

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Total Records: 65

Element

Atomic No

Formula

Spectral Line

Energy (eV)

Details

5d_5/2

23.30

5d_3/2

27.10

5p_3/2

93.50

5p_1/2

118.80

NbS₂

4p_3/2

32.10

NbS₂

4p_1/2

34.40

NbS₂

3d_5/2

203.50

NbS₂

3d_3/2

206.30

TaS₂

4f_7/2

23.60

TaS₂

4f_5/2

25.50

TaS₂

5p_3/2

34.70

TaS₂

5p_1/2

46.60

TaS₂

4d_5/2

226.90

TaS₂

4d_3/2

239.60

Bi₂S₃

5d_5/2

25.70

Bi₂S₃

5d_3/2

28.80

Bi₂S₃

4f_7/2

158.70

Bi₂S₃

4f_5/2

164.00

PbS

5d_5/2

19.10

PbS

5d_3/2

21.60

PbS

4f_7/2

137.80

PbS

4f_5/2

142.70

TiS₂

35.50

TiS₂

60.30

SnS₂

26.70

SnS

24.90

(SnS)₁.₂₀TiS₂

35.50

(SnS)₁.₂₀TiS₂

60.10

(PbS)₁.₁₄NbS₂

5d_5/2

19.10

(PbS)₁.₁₄NbS₂

5d_3/2

21.70

Data Processing:

Photoelectron Line

5d_5/2

25.70

Background Subtraction Method:

Peak Location Method:

data

Full Width at Half-maximum Intensity (eV):

1.2

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

FL = Fermi level

Charge Reference:

Conductor

Energy Scale Evaluation:

Reliable (reported energy within 300 eV of a reference energy)

Comment:

The sample was synthesized by heating Bi with the correct molar amount of S for one week. After cooling, small crystals were selected.

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):

300