NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

Bi₂S₃

bismuth sulfide

1345-07-9

chalcogenide, sulfide

Citation:

Author Name(s):

Ettema A.R.H.F., Haas C.

Journal:

J. Phys. Cond. Matter 5, 3817

DOI:

Pub Year:

1993

book All Records in this Publication

Data Processing:

Photoelectron Line

4f_5/2

164.00

Background Subtraction Method:

Peak Location Method:

data

Full Width at Half-maximum Intensity (eV):

1.1

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

FL = Fermi level

Charge Reference:

Conductor

Energy Scale Evaluation:

Reliable (reported energy within 300 eV of a reference energy)

Comment:

The sample was synthesized by heating Bi with the correct molar amount of S for one week. After cooling, small crystals were selected.

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):

300