NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

ZrSiO₄

zirconium silicate

14940-68-2

double oxide, mineral, oxide, silicate

Citation:

Author Name(s):

Dementjev A.P., Ivanova O.P., Vasilyev L.A., Naumkin A.V., Nemirovsky D.M., Shalaev D.Y.

Journal:

J. Vac. Sci. Technol. A 12, 423

DOI:

Pub Year:

1994

book All Records in this Publication

Data Processing:

Photoelectron Line

531.80

Background Subtraction Method:

Shirley

Peak Location Method:

data

Full Width at Half-maximum Intensity (eV):

2.6

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Charge Reference:

Adventitious carbon

Energy Scale Evaluation:

Reliable, with one-point correction of energy scale

Comment:

Zircon.

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):

300