NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

Element:

Formula:

Na₅₅Al₅₄Si₁₃₈O₃₈₄

Name:

sodium aluminum silicate

CAS Registry No:

Class:

alkali, molecular sieve, silicate

Citation:

Author Name(s):

Grunert W., Schlogl R., Karge H.G.

Journal:

Surf. Interface Anal. 20, 603

DOI:

Pub Year:

1993

book All Records in this Publication

Data Processing:

Photoelectron Line

532.05

Background Subtraction Method:

Peak Location Method:

data

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Charge Reference:

Adventitious carbon

Energy Scale Evaluation:

Reliable, with one-point correction of energy scale

Comment:

NaY - zeolite. The sample was deposited onto the metal sample holder from a suspension in pentane previously agitated in an ultrasonic bath.

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):

300