NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

Element:

Formula:

C₆₀F₄₆/Si

XPS Formula:

carbon atoms attached to C

Name:

carbon fluoride/silicon

CAS Registry No:

Class:

Citation:

Author Name(s):

Benning P.J., Ohno T.R., Weaver J.H., Mukherjee P., Adcock J.L., et al.

Journal:

Phys. Rev. B 47, 1589

DOI:

Pub Year:

1993

bookAll Records in this Publication

Data Processing:

Photoelectron Line

284.80

Background Subtraction Method:

Peak Location Method:

data

Full Width at Half-maximum Intensity (eV):

1.7

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Anode Material:

other source

X-ray Energy:

380

Overall Energy Resolution (eV):

1.4

Calibration:

Charge Reference:

Internal hydrocarbon

Energy Scale Evaluation:

Reliable, with one-point correction of energy scale

Comment:

40 - 80 A C60F46 were deposited onto cleaved in situ Si(111). The thickness was measured using a quartz-crystal thickness monitor.

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):

300