NIST X-ray Photoelectron Spectroscopy Database

Click the column to sort in ascending or descending order.
Enter a string in the input box in the column header and press the enter to filter the search result in the selected column.
Click on the hyperlink in the column for more information.

Total Records: 6

Element

Atomic No

Formula

Spectral Line

Energy (eV)

Details

Si/O₂

CS-2p

0.00

Si/O₂

CS-2p

0.97

Si/O₂

CS-2p

1.80

Si/O₂

CS-2p

2.60

O₂/Si

CS-2p

3.82

Si/O₂

DS-2p

0.61

Data Processing:

Chemical Shift

CS-2p

0.00

Background Subtraction Method:

Shirley

Peak Location Method:

other type of curve fit

Full Width at Half-maximum Intensity (eV):

0.41

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Anode Material:

other source

X-ray Energy:

130

Overall Energy Resolution (eV):

Calibration:

Charge Reference:

Element

Energy Scale Evaluation:

Reliable (reported energy within 300 eV of a reference energy)

Comment:

6E3 L O2/Si(100)-(2x1). Adsorption of O2 was performed at 2E-5 Torr at 1023 K for 5 min. Emission angle = 36 degrees.

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Low-energy Electron Diffraction

Specimen Temperature (K):

300