NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0
Details Summary:
Tab Page Summary
General:
W
W
surface component
tungsten
7440-33-7
element
Citation:
Kim B., Chen J., Erskine J.L., Mei W.N., Wei C.M.
Phys. Rev. B 48, 4735
Pub Year:
1993
Data Processing:
Photoelectron Line
4f7/2
31.15
mixed Gaussian/Lorentzian
0.150
0.084
Measurement:
Anode Material:
other source
X-ray Energy:
92
Overall Energy Resolution (eV):
0.15
Calibration:
FL = Fermi level
Charge Reference:
Conductor
Energy Scale Evaluation:
Reliable (reported energy within 300 eV of a reference energy)
Comment:
W(110). The sample was cleaned by annealing in O2 followed by flashing to 2300 K. Singularity index = 0.063.
Specimen:
Method of Determining Specimen Composition:
Auger Electron Spectroscopy
Method of Determining Specimen Crystallinity:
Low-energy Electron Diffraction
Specimen Temperature (K):
300