Tab Page Summary
element, II-VI semiconductor, IV semiconductor
Dufour G., Rochet F., Roulet H., Sirotti F.
mixed Gaussian/Lorentzian
Anode Material:
other source
Overall Energy Resolution (eV):
0.3
Calibration:
FL = Fermi level
Charge Reference:
Element
Energy Scale Evaluation:
Reliable (reported energy within 300 eV of a reference energy)
Comment:
Si(001)-(2x1). The sample was cleaned by heating at 1323 K for 15 s. The relative intensity was 0.144. Branching ratio = 0.5.
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
Low-energy Electron Diffraction
Specimen Temperature (K):
300