NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

Hg/Si

mercury/silicon

7439-97-6

element

Citation:

Author Name(s):

Li D., Lin J., Li W., Lee S., Vidali G., and Dowben P.A.

Journal:

Surf. Sci. 280, 71

DOI:

Pub Year:

1993

bookAll Records in this Publication

Data Processing:

Photoelectron Line

5d_5/2

8.10

0.05

Background Subtraction Method:

Peak Location Method:

data

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Yes

Anode Material:

other source

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

FL = Fermi level

Charge Reference:

Conductor

Energy Scale Evaluation:

Reliable (reported energy within 300 eV of a reference energy)

Comment:

0.2 and 0.5 L Hg/Si(111)-(7x7) doped with a carrier concentration of 7E14 cm-3. The spectra were recorded at normal emission.

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Low-energy Electron Diffraction

Specimen Temperature (K):

110