NIST X-ray Photoelectron Spectroscopy Database

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Total Records: 4

Data Processing:

Photoelectron Line

2p_3/2

293.90

Background Subtraction Method:

Peak Location Method:

data

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Yes

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

0.6

Calibration:

FL = Fermi level

Charge Reference:

Conductor

Energy Scale Evaluation:

Reliable (reported energy within 300 eV of a reference energy)

Comment:

K2.8C60/n-type GaAs(110). The 130 A C60 sample was grown and doped with K at ~ 460 K with subsequent annealing (T = ~ 480 K, time = 15 - 20 min). The thickness was measured using a quartz-crystal thickness monitor. LEED (1x1) pattern. Fcc structure.

Specimen:

Method of Determining Specimen Composition:

X-ray Photoelectron Spectroscopy

Method of Determining Specimen Crystallinity:

Low-energy Electron Diffraction

Specimen Temperature (K):

300