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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:
Summary Page
Tab Page Summary

General:
Element:
W
Formula:
WSe2
Name:
tungsten diselenide
CAS Registry No:
12067-46-8
Class:
chalcogenide, II-VI semiconductor, IV-VI semiconductor, selenide

Citation:
Author Name(s):
Salitra G., Hodes G., Klein E., Tenne R.
Journal:
Thin Solid Films 245, 180
DOI:
Pub Year:
1994

Data Processing:
Data Type:
Photoelectron Line
Line Designation:
4f7/2
Binding Energy (eV)
32.70
Energy Uncertainty:
Background Subtraction Method:
Peak Location Method:
data
Full Width at Half-maximum Intensity (eV):
Gaussian Width (eV):
Lorentzian Width (eV):

Measurement:
Use of X-ray Monochromator:
No
Anode Material:
X-ray Energy:
Overall Energy Resolution (eV):
Calibration:
Charge Reference:
Adventitious carbon
Energy Scale Evaluation:
Reliable (reported energy within 300 eV of a reference energy)
Comment:
2000 A WSe2/200 A Cr84Ni16. WSe2 was deposited at 1223 K. The composition determined by XPS was WSe2.11. Hexagonal 2H phase.

Specimen:
Specimen:
Method of Determining Specimen Composition:
X-ray Photoelectron Spectroscopy
Method of Determining Specimen Crystallinity:
X-ray Diffraction
Specimen Temperature (K):
300
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