NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

C

CF₃(CF₂)₇C(O)NH(CH₂)₂SH/Au

CF₃(CF₂)₇C(O)NHC*H₂CH₂SH

2,2,3,3,4,4,5,5,6,6,7,7,8,8,9,9,9-heptadecafluoro-N-(2-mercaptoethyl)nonanamide/gold

CAS Registry No:

amide, halogenated compound, nitrogen, thiol

Citation:

Author Name(s):

Lenk T.J., Hallmark V.M., Hoffmann C.L., Rabolt J.F., Castner D.G., Erdelen C., et al.

Langmuir 10, 4610

Pub Year:

1994

book All Records in this Publication

Data Processing:

Photoelectron Line

Line Designation:

1s

Binding Energy (eV)

285.40

Energy Uncertainty:

Background Subtraction Method:

Peak Location Method:

data

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Yes

Anode Material:

Al

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Au4f7 = 84.00

Charge Reference:

Conductor

Energy Scale Evaluation:

Reliable (reported energy within 300 eV of a reference energy)

Comment:

The film thickness was measured by XPS. The spectra were recorded at normal emission and 55 and 80 degrees. The composition determined by XPS at 55 degrees was Au16.9F53.6C26.8S1.1N1.6.

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):

300

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