NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0
Details Summary:
Tab Page Summary
General:
Tm
Tm/W
thulium/tungsten
7440-30-4
element
Citation:
Badenbach M., Hohr A., Laubschat C., Kaindl G., Methfessel M.
Phys. Rev. B 50, 14446
Pub Year:
1994
Data Processing:
Surface Core-level Shift
SS-4f7/2
0.05
other type of curve fit
Measurement:
Anode Material:
other source
X-ray Energy:
40-60
Overall Energy Resolution (eV):
Calibration:
Charge Reference:
Conductor
Energy Scale Evaluation:
Reliable (reported energy within 300 eV of a reference energy)
Comment:
~ 100 A Tm(0001)/W(110). The spectra were recorded at normal emission. The thickness was measured using a quartz-crystal thickness monitor.
Specimen:
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
Low-energy Electron Diffraction
Specimen Temperature (K):
300