NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

Element:

Formula:

N(C₃H₇)₄[RuO(OC(C₂H₅)₂C(O)O)₂]

XPS Formula:

N*(C₃H₇)₄[RuO(OC(C₂H₅)₂C(O)O)₂]

Name:

tetrapropylammonium bis(2-ethyl-2-hydroxybutyrato)oxoruthenate(V)

CAS Registry No:

Class:

acid, ester, nitrogen, substituted ammonium

Citation:

Author Name(s):

Redshaw C., Clegg W., Clegg W.

Journal:

J. Chem. Soc. Dalton Trans. 2059

DOI:

Pub Year:

1992

book All Records in this Publication

Data Processing:

Photoelectron Line

402.10

Background Subtraction Method:

Peak Location Method:

data

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Charge Reference:

Internal hydrocarbon

Energy Scale Evaluation:

Reliable, with one-point correction of energy scale

Comment:

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

X-ray Diffraction

Specimen Temperature (K):

300