NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

Element:

Formula:

SHCH₂CH(NH₂)COOH/Cu

XPS Formula:

SHC*H₂C*H(NH₂)COOH/Cu

Name:

L - cysteine/copper

CAS Registry No:

52-90-4

Class:

amino acid/its derivatives, organic acid, thiol

Citation:

Author Name(s):

Uvdal K., Bodo P., Liedberg B.

Journal:

J. Colloid Interface Sci. 149, 162

DOI:

Pub Year:

1992

book All Records in this Publication

Data Processing:

Photoelectron Line

286.50

0.2

Background Subtraction Method:

other

Peak Location Method:

other type of curve fit

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Ag,Cu = 368.27,932.67

Charge Reference:

Conductor

Energy Scale Evaluation:

Reliable, with two-point correction of energy scale

Comment:

The composition determined by XPS was C3.18NS0.80O1.82. The relative intensity was 0.71. The film thickness measured by XPS was 60 A.

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):

223