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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:
Summary Page
Tab Page Summary

General:
Element:
C
Formula:
SHCH2CH(NH2)COOH/Cu
XPS Formula:
SHC*H2C*H(NH2)COOH/Cu
Name:
L - cysteine/copper
CAS Registry No:
52-90-4
Class:
amino acid/its derivatives, organic acid, thiol

Citation:
Author Name(s):
Uvdal K., Bodo P., Liedberg B.
Journal:
J. Colloid Interface Sci. 149, 162
DOI:
Pub Year:
1992

Data Processing:
Data Type:
Photoelectron Line
Line Designation:
1s
Binding Energy (eV)
286.50
Energy Uncertainty:
0.2
Background Subtraction Method:
other
Peak Location Method:
other type of curve fit
Full Width at Half-maximum Intensity (eV):
Gaussian Width (eV):
Lorentzian Width (eV):

Measurement:
Use of X-ray Monochromator:
No
Anode Material:
Mg
X-ray Energy:
Overall Energy Resolution (eV):
Calibration:
Ag,Cu = 368.27,932.67
Charge Reference:
Conductor
Energy Scale Evaluation:
Reliable, with two-point correction of energy scale
Comment:
The composition determined by XPS was C3.18NS0.80O1.82. The relative intensity was 0.71. The film thickness measured by XPS was 60 A.

Specimen:
Specimen:
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
Specimen Temperature (K):
223
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