NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

Element:

Formula:

NaAlSi₂O₆.H₂O

Name:

sodium aluminum silicate hydrate (NaAlSi2O6.H2O)

CAS Registry No:

Class:

alkali, hydrate, mineral, silicate

Citation:

Author Name(s):

He H., Barr T.L., Klinowski J.

Journal:

J. Phys. Chem. 98, 8124

DOI:

Pub Year:

1994

book All Records in this Publication

Data Processing:

Photoelectron Line

74.20

0.1

Background Subtraction Method:

Peak Location Method:

data

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Charge Reference:

Adventitious carbon

Energy Scale Evaluation:

Reliable, with one-point correction of energy scale

Comment:

Analcime. The Si/Al composition ratio determined by XPS was 1.5.

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):

300