NIST X-ray Photoelectron Spectroscopy Database

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Total Records: 13

Element

Atomic No

Formula

Spectral Line

Energy (eV)

Details

(^-C₄HS((CH₂)₅CH₃)^-)n

284.80

(^-C₄HS((CH₂)₅CH₃)^-)n

2p_1/2

165.10

(^-C₄HS((CH₂)₅CH₃)^-)n

2p_3/2

163.95

Cu/(^-C₄HS((CH₂)₅CH₃)^-)n

2p_1/2

165.10

Cu/(^-C₄HS((CH₂)₅CH₃)^-)n

2p_3/2

163.95

Cu/(^-C₄HS((CH₂)₅CH₃)^-)n

2p_3/2

161.08

Cu/(^-C₄HS((CH₂)₅CH₃)^-)n

2p_1/2

161.75

(^-C₄HS((CH₂)₅CH₃)^-)n

2p_3/2

163.95

(^-C₄HS((CH₂)₅CH₃)^-)n

2p_1/2

165.10

Cu/(^-C₄HS((CH₂)₅CH₃)^-)n

2p_1/2

165.10

Cu/(^-C₄HS((CH₂)₅CH₃)^-)n

2p_1/2

162.88

Cu/(^-C₄HS((CH₂)₅CH₃)^-)n

2p_3/2

163.95

Cu/(^-C₄HS((CH₂)₅CH₃)^-)n

2p_3/2

161.75

Data Processing:

Photoelectron Line

2p_1/2

165.10

Background Subtraction Method:

Shirley

Peak Location Method:

Gaussian

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Charge Reference:

Internal hydrocarbon

Energy Scale Evaluation:

Reliable, with one-point correction of energy scale

Comment:

18 A Cu/(-C4HS((CH2)5CH3)-)n.The C/S composition ratio determined by XPS was 10. Branching ratio = 0.5. FAT mode. The thickness was measured using a quartz-crystal thickness monitor.

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):

300